Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction
- P.-C. Wang
- G.S. Cargill
- et al.
- 1998
- Applied Physics Letters
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35 results for G.S. Cargill
Local and global stress distributions in BEOL metallization
- I.C. Noyan
- E. Liniger
- et al.
- 1996
- MRS Spring Meeting 1996
Characterization of lattice strain from DX centers and persistent photocarriers in GaAlAs
- G.S. Cargill III
- A. Segmüller
- et al.
- 1995
- Materials Chemistry & Physics
EXAFS studies of arsenic in amorphous silicon
- G.S. Cargill III
- M. Matsuura
- 1992
- Journal of Non-Crystalline Solids
Lattice strain from DX centers and persistent photocarriers in Sn-doped and Si-doped Ga1-xAlxAs
- G.S. Cargill III
- A. Segmüller
- et al.
- 1992
- Physical Review B
Lattice strain from substitutional Ga and from holes in heavily doped Si:Ga
- K.L. Kavanagh
- G.S. Cargill III
- 1992
- Physical Review B
Lattice parameters and local atomic structure of silicon-rich Si-Ge/Si (100) films
- M. Matsuura
- J.M. Tonnerre
- et al.
- 1991
- Physical Review B
Electrochemical experiments in cold nuclear fusion
- J.F. Ziegler
- T.H. Zabel
- et al.
- 1989
- Physical Review Letters
EXAFS study of atomic structure and relaxation phenomena in amorphous Tb20Fe80
- Mahesh G. Samant
- Clifford J. Robinson
- et al.
- 1988
- Journal of Non-Crystalline Solids
Atomic structure and thermal stability in amorphous rareââ¬Âearthââ¬âtransitionââ¬Âmetal magnetoââ¬Âoptic alloys (abstract)
- C.J. Robinson
- M.G. Samant
- et al.
- 1988
- Journal of Applied Physics