Electromigration in sub-micron Cu interconnects in low k dielectrics
- B.N. Agarwala
- D. Nguyen
- et al.
- 2005
- ECS Meeting 2005
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Charge trapping & NBTI in high k gate dieectric stacks
- Sufi Zafar
- A.C. Callegari
- et al.
- 2005
- ECS Meeting 2005