Selected topics in ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2013
- IEEE TNS
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64 results at IEEE TNS
An investigation of single event transient response in 45-nm and 32-nm SOI RF-CMOS devices and circuits
- Troy D. England
- Rajan Arora
- et al.
- 2013
- IEEE TNS
Ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2012
- IEEE TNS
Hardness assurance testing for proton direct ionization effects
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2012
- IEEE TNS
Trade-offs between RF performance and total-dose tolerance in 45-nm RF-CMOS
- Rajan Arora
- En Xia Zhang
- et al.
- 2011
- IEEE TNS
32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2011
- IEEE TNS
Comparison of single and two-photon absorption for laser characterization of single-event upsets in SOI SRAMs
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2011
- IEEE TNS
Characterization of parasitic bipolar transistors in 45 nm silicon-on-insulator technology
- Larry Wissel
- Phil Oldiges
- et al.
- 2010
- IEEE TNS
Alpha-particle emission energy spectra from materials used for solder bumps
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE TNS
Evaluating the influence of various body-contacting schemes on single event transients in 45-nm SOI CMOS
- Kurt A. Moen
- Stanley D. Phillips
- et al.
- 2010
- IEEE TNS