Publications

465 results at IEEE T-ED

1 μm MOSFET VLSI Technology: Part VIIII—Radiation Effects
- - John M. Aitken
- 1979
- IEEE T-ED
1 μm MOSFET VLSI Technology: Part V—A Single-Level Polysilicon Technology Using Electron-Beam Lithography
- - William R. Hunter
  - Linda Ephrath
  - et al.
- 1979
- IEEE T-ED
Electron-Beam Resist Edge Profile Simulation
- - David F. Kyser
  - Chiu H. Ting
- 1979
- IEEE T-ED
VLSI Limitations from Drain-Induced Barrier Lowering
- - Ronald R. Troutman
- 1979
- IEEE T-ED
Simple Analytical Models for the Temperature Dependent Threshold Behavior of Depletion-Mode Devices
- - Fritz H. Gaensslen
- 1979
- IEEE T-ED
1 μm MOSFET VLSI Technology: Part VI—Electron-Beam Lithography
- - Warren D. Grobman
  - Hans E. Luhn
  - et al.
- 1979
- IEEE T-ED
1 μm MOSFET VLSI Technology: Part Ill—Logic Circuit Design Methodology and Applications
- - Peter W. Cook
  - Stanley E. Schuster
  - et al.
- 1979
- IEEE T-ED
The Evolution of Digital Electronics Towards VLSI
- - Robert W. Keyes
- 1979
- IEEE T-ED
1 µm MOSFET VLSI Technology: Part 1-An Overview
- - Hwa-Nien Yu
  - Arnold Reisman
  - et al.
- 1979
- IEEE T-ED
1 μm MOSFET VLSI Technology: Part IV—Hot-Electron Design Constraints
- - Tak H. Ning
  - Peter W. Cook
  - et al.
- 1979
- IEEE T-ED