Characterization of nitrogen-containing glasses by x-ray photoelectron spectroscopyG.H. FrischatR. Fern1986JVSTA
Summary Abstract: Reactive ion-etching-related Si surface residues and subsurface disorderG.S. OehrleinJ.G. Clabeset al.1986JVSTA
Time and angle resolved ultraviolet photoemission spectroscopy studies of single crystal surface and interfacesJ. BokorR.R. Freemanet al.1986JVSTA
Summary Abstract: Non-bulk-like physical properties of thin films due to ion bombardment during film growthEric Kay1986JVSTA
A simplified scanning tunneling microscope for surface science studiesJ.E. DemuthR.J. Hamerset al.1986JVSTA
Surface processes leading to carbon contamination of photochemically deposited copper filmsF.A. HouleR.J. Wilsonet al.1986JVSTA
Summary Abstract: Classical trajectory calculations of photon-stimulated desorption of ions from alkali-halidesR.E. WalkupPh. Avouris1986JVSTA