A case study of electromigration reliability: From design point to system operations
- Baozhen Li
- Paul Muller
- et al.
- 2015
- IRPS 2015
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15 results at IRPS 2015
Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET
- Miaomiao Wang
- Zuoguang Liu
- et al.
- 2015
- IRPS 2015
Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology
- Pong-Fei Lu
- Keith A. Jenkins
- et al.
- 2015
- IRPS 2015
Time-integrated photon emission as a function of temperature in 32 nm CMOS
- Andrea Bahgat Shehata
- Alan J. Weger
- et al.
- 2015
- IRPS 2015
Analyzing path delays for accelerated testing of logic chips
- Emily Ray
- Barry P. Linder
- et al.
- 2015
- IRPS 2015
Non-volatile memory as hardware synapse in neuromorphic computing: A first look at reliability issues
- Robert M. Shelby
- Geoffrey W. Burr
- et al.
- 2015
- IRPS 2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
- Franco Stellari
- Keith A. Jenkins
- et al.
- 2015
- IRPS 2015
A method for rapid screening of various low-k TDDB models
- F. Chen
- Carole Graas
- et al.
- 2015
- IRPS 2015
Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications
- C. Kothandaraman
- X. Chen
- et al.
- 2015
- IRPS 2015
Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability
- Mukta Farooq
- Giuseppe La Rosa
- et al.
- 2015
- IRPS 2015