Publications

13 results at IEEE Design and Test

Fair and Comprehensive Benchmarking of Machine Learning Processing Chips
- - Geoffrey W. Burr
  - SukHwan Lim
  - et al.
- 2022
- IEEE Design and Test
Enabling Design Methodologies and Future Trends for Edge AI: Specialization and Codesign
- - Cong Hao
  - Jordan Dotzel
  - et al.
- 2021
- IEEE Design and Test
Report on First and Second ACM/IEEE Workshop on Machine Learning for CAD (MLCAD)
- - Marilyn Wolf
  - Jorg Henkel
  - et al.
- 2021
- IEEE Design and Test
Guest Editors' Introduction: Selected Papers from IEEE VLSI Test Symposium
- - Stefano Di Carlo
  - Peilin Song
  - et al.
- 2020
- IEEE Design and Test
Training large-scale artificial neural networks on simulated resistive crossbar arrays
- - Malte J. Rasch
  - Tayfun Gokmen
  - et al.
- 2020
- IEEE Design and Test
A Survey on Architecture Advances Enabled by Emerging Beyond-CMOS Technologies
- - An Chen
  - Supriyo Datta
  - et al.
- 2019
- IEEE Design and Test
A Diagnosable Network-on-Chip for FPGA Verification of Intellectual Properties
- - Kyuseung Han
  - Jae Jin Lee
  - et al.
- 2019
- IEEE Design and Test
Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms
- - Wisam Kadry
  - Dimtry Krestyashyn
  - et al.
- 2017
- IEEE Design and Test
Highlights of ICCAD 2016
- - Frank Liu
- 2017
- IEEE Design and Test
From the Heart of Silicon Valley to the Hill Country-Highlights of ICCAD 2015
- - Frank Liu
- 2016
- IEEE Design and Test