SHORT-TIME ANNEALING OF DRY-ETCHING DAMAGE.
C.M. Ransom, T.O. Sedgwick, et al.
ECS Meeting 1983
Barrier property, gap-fill quality, and electromigration (EM) resistance of a TaN diffusion barrier with ultrathin-Cu/Ru(Ta) liner layers were carried out to evaluate its feasibility for back-end-of-the-line Cu/low-κ interconnects. Ru/TaN and Ru0.9Ta0.1TaN liner stacks show comparable oxidation and Cu diffusion barrier properties to the conventional Ta/TaN bilayer liner stack. Through observed better wettability to ultrathin Cu seed and therefore enhanced gap-fill quality, both Ru/TaN and Ru 0.9Ta0.1TaN liner stacks show EM resistance improvement over the Ta/TaN bilayer liner system. © 2010 IEEE.
C.M. Ransom, T.O. Sedgwick, et al.
ECS Meeting 1983
R. Filippi, J.F. McGrath, et al.
IRPS 2004
C.-C. Yang, T.M. Shaw, et al.
Electrochemical and Solid-State Letters
C.-C. Yang, Y. Loquet, et al.
ADMETA 2011