Conference paper
Perimeter effects in small geometry bipolar transistors
Wai Lcc, Jack Y.-C. Sun, et al.
VLSI Technology 1992
A test for the correct measurement of cutoff frequency of bipolar transistors is described. The method tests the equality of the low frequency, small signal, current gain measured by network analyzer, and by dc current measurements. The method is described, and sample data are shown to demonstrate its practical application. © 1991 IEEE
Wai Lcc, Jack Y.-C. Sun, et al.
VLSI Technology 1992
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