Conference paperNEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.S. Cohen, T.O. Sedgwick, et al.MRS Proceedings 1983
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Workshop paperNLPeople at L+M-24 Shared Task: An Ensembled Approach for Molecule Captioning from SMILESShinnosuke Tanaka, Carol Mak, et al.ACL 2024
