Erich P. Stuntebeck, John S. Davis II, et al.
HotMobile 2008
As microprocessor speeds approach 1 GHz and beyond, the difficulties of at-speed testing continue to increase. In particular, automated test equipment which operates at these frequencies is very limited. This paper discusses a design-for-test method which serializes parallel circuit inputs and de-serializes circuit outputs to achieve 1 GHz operation on test equipment operating at frequencies below 100 MHz. This method has been used to successfully characterize the operation of a 1 GHz microprocessor chip.
Erich P. Stuntebeck, John S. Davis II, et al.
HotMobile 2008
Raymond Wu, Jie Lu
ITA Conference 2007
Pradip Bose
VTS 1998
Ehud Altman, Kenneth R. Brown, et al.
PRX Quantum