A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
The diffusion of an organic solvent, N‐methylpyrollidinone (NMP), in a fully imidized photosensitive polyimide, 4,4′‐benzophenone tetracarboxylic dianhydride (BTDA–tMDA), was investigated. The polyimide (PI) films were prepared by spin‐coating, soft‐bake, deep UV exposure, and final‐baked to a peak temperature ranging from 230 to 375°C. The thickness of the final films is approximately 5.0 μm. Patterned metal was then electronbeam‐evaporated through a molybdenum shadow mask over the PI surface. The rate of lateral (in‐plane) diffusion of NMP in the PI covered with metal follows Fick's \documentclass{article}\pagestyle{empty}\begin{document}\end{document} relationship over a temperature range of 40–85°C. The rate of diffusion was shown to increase with increasing NMP temperatures, typical of a thermal‐activated process. The diffusion coefficients, as measured by the solvent penetration distance as a function of the square root of time, were found to obey the Arrhenius equation: D = D0 × exp(−Q/RT) cm2/s, where the frequency factor, D0, ranges from 0.0015 to 0.0045 cm2/s, and the activation energy, Q, ranges from 5.52–6.34 kcal/mol. Both D0 and Q decrease with increasing PI baking temperatures. © 1992 John Wiley & Sons, Inc. Copyright © 1992 John Wiley & Sons, Inc.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
A. Krol, C.J. Sher, et al.
Surface Science
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008