Benjamin Reiser, Emmanuel Yashchin, et al.
Nonlinear Analysis, Theory, Methods and Applications
In many practical situations the variance of a set of measurements can be attributed to several known sources of variability. For example, if several measurements of each item of a lot are taken, then one may need to deal not only with the within-item variability, but also with item-to-item within-lot and lot-to-lot components of variability. In such cases conventional control charts tend to produce an unacceptably high rate of false alarms and in general represent a rather weak diagnostic tool. This article shows how to build a control system based on likelihood ratio tests capable of monitoring the mean and variance components of a nested random effect model. The strong points and weaknesses of this approach are compared to those of competing methods, and some examples related to manufacturing of integrated circuits are discussed. © 1995 Taylor & Francis Group, LLC.
Benjamin Reiser, Emmanuel Yashchin, et al.
Nonlinear Analysis, Theory, Methods and Applications
Emmanuel Yashchin
IBM J. Res. Dev
Emmanuel Yashchin
IWISQC 2010
Mary Y.L. Wisniewski, Emmanuel Yashchin, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems