J. Paraszczak, D. Edelstein, et al.
IEDM 1993
A device is presented that sweeps out programmable optical delays of 300 ps (or less) at 30 Hz, with shorter-delay scans possible at much higher rates. It is compact, vibration-free, linear to within 0.02%, and has a position repeatability of 1 part in 105. With this scanner and a PC-based signal-averaging data acquisition system, ultrafast autocorrelation measurements with very high signal/noise are demonstrated in both the fs and ps domains.
J. Paraszczak, D. Edelstein, et al.
IEDM 1993
Son Nguyen, Eric Liniger, et al.
ECS Meeting 2007
J. Heidenreich, D. Edelstein, et al.
IITC 1998
Takeshi Nogami, J. Maniscalco, et al.
IITC 2010