C.-C. Yang, F. Chen, et al.
IEEE Electron Device Letters
A device is presented that sweeps out programmable optical delays of 300 ps (or less) at 30 Hz, with shorter-delay scans possible at much higher rates. It is compact, vibration-free, linear to within 0.02%, and has a position repeatability of 1 part in 105. With this scanner and a PC-based signal-averaging data acquisition system, ultrafast autocorrelation measurements with very high signal/noise are demonstrated in both the fs and ps domains.
C.-C. Yang, F. Chen, et al.
IEEE Electron Device Letters
A. Deutsch, M. Scheuermann, et al.
IEEE Microwave and Guided Wave Letters
F. Chen, J. Gill, et al.
Microelectronics Reliability
D. Edelstein
Microelectronic Manufacturing 1998