Aditya Bansal, Keunwoo Kim, et al.
ICICDT 2007
An on-chip digital characterization method for local random variation in a process is presented. The method uses a sense-amplifier-based test circuit that uses digital voltage measurement instead of the analog current measurements of conventional techniques. The proposed circuit helps design fast on-chip built-in-self-test schemes for measuring random variation. A testchip is designed in 0.13μm CMOS and measured to show the effectiveness of the proposed circuit in extracting local random variation. ©2007 IEEE.
Aditya Bansal, Keunwoo Kim, et al.
ICICDT 2007
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
C. Zhou, Keith A. Jenkins, et al.
IRPS 2018
Stas Polonsky, Keith A. Jenkins
ISDRS 2003