Ali Khakifirooz, Kangguo Cheng, et al.
IEEE Electron Device Letters
We detail the use of ring oscillators (ROs) for yield learning during the research phase of a CMOS technology generation. Failing circuits are located and classified based on electrical analysis of ROs and FETs (Field Effect Transistor) wired out from RO environments. Based on electrical data and binning methods, we improve detection and classification fault methodologies and form a yield detractor pareto. Inline defect monitoring can help to estimate RO yield and is essential in CMOS technology research.
Ali Khakifirooz, Kangguo Cheng, et al.
IEEE Electron Device Letters
Xiaobin Yuan, Jae-Eun Park, et al.
IIRW 2007
Ruilong Xie, Pietro Montanini, et al.
IEDM 2016
Bruce Doris, Ali Khakifirooz, et al.
IEEE International SOI Conference 2011