Publications

76 results for E. Gusev

Charge trapping and annealing in high-k gate dielectrics
- - James A. Felix
  - Marty R. Shaneyfelt
  - et al.
- 2004
- IEEE TNS
Selectively formed high mobility strained Ge PMOSFETs for high performance CMOS
- - Hulling Shang
  - Jack O. Chu
  - et al.
- 2004
- IEDM 2004
Ultra-fast measurements of the inversion charge in MOSFETs and impact on measured mobility in high-k MOSFETs
- - D. Singh
  - P. Solomon
  - et al.
- 2004
- IEDM 2004
Charge trapping in aggressively scaled metal gate/high-κ stacks
- - E. Gusev
  - V. Narayanan
  - et al.
- 2004
- IEDM 2004
Advanced gate stacks with fully silicided (FUSI) gates and high-κ dielectrics: Enhanced performance at reduced gate leakage
- - E. Gusev
  - C. Cabral Jr.
  - et al.
- 2004
- IEDM 2004
Interface engineering for enhanced electron mobilities in W/HfO ₂ gate stacks
- - A.C. Callegari
  - P. Jamison
  - et al.
- 2004
- IEDM 2004
Systematic study of pFET V_t with Hf-based gate stacks with poly-Si and FUSI gates
- - E. Cartier
  - V. Narayanan
  - et al.
- 2004
- VLSI Technology 2004
Surface potential and morphology issues of annealed (HfO ₂) _x(SiO ₂) _1-x gate oxides
- - R. Ludeke
  - P. Lysaght
  - et al.
- 2004
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Structural and surface potential characterization of annealed HfO ₂ and (HfO ₂) _x(SiO ₂) _1-x films
- - R. Ludeke
  - E. Gusev
- 2004
- Journal of Applied Physics
Valence and conduction band offsets of a ZrO₂/SiO _xN_y/n-Si CMOS gate stack: A combined photoemission and inverse photoemission study
- - S. Sayan
  - R.A. Bartynski
  - et al.
- 2004
- physica status solidi (b)