Self-repairing SRAM using on-chip detection and compensation
- Niladri Narayan Mojumder
- Saibal Mukhopadhyay
- et al.
- 2010
- IEEE Transactions on VLSI Systems
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30 results for Saibal Mukhopadhyay
Design of sub-90 nm low-power and variation tolerant PD/SOI SRAM cell based on dynamic stability metrics
- Rajiv V. Joshi
- Saibal Mukhopadhyay
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
An on-chip test structure and digital measurement method for statistical characterization of local random variability in a process
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2008
- IEEE Journal of Solid-State Circuits
Optimal dual-VT design in sub-100-nm PD/SOI and double-gate technologies
- Aditya Bansal
- Jae-Joon Kim
- et al.
- 2008
- IEEE Transactions on Electron Devices
Device design and optimization methodology for leakage and variability reduction in sub-45-nm FD/SOI SRAM
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2008
- IEEE Transactions on Electron Devices
Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50 nm double gate devices
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- Microelectronics Journal
Design of a process variation tolerant self-repairing SRAM for yield enhancement in nanoscaled CMOS
- Saibal Mukhopadhyay
- Keejong Kim
- et al.
- 2007
- IEEE Journal of Solid-State Circuits
Device-optimization technique for robust and low-power FinFET SRAM design in NanoScale era
- Aditya Bansal
- Saibal Mukhopadhyay
- et al.
- 2007
- IEEE Transactions on Electron Devices
Modeling and analysis of leakage currents in double-gate technologies
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2006
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A forward body-biased low-leakage SRAM cache: Device, circuit and architecture considerations
- Chris Hyung-Il Kim
- Jae-Joon Kim
- et al.
- 2005
- IEEE Transactions on VLSI Systems