Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam
- Nathaniel A. Dodds
- James R. Schwank
- et al.
- 2014
- IEEE TNS
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48 results for Michael S. Gordon
Criticality of low-energy protons in single-event effects testing of highly-scaled technologies
- Jonathan A. Pellish
- Paul W. Marshall
- et al.
- 2014
- IEEE TNS
Sources of variability in alpha emissivity measurements at la and ULA levels, a multicenter study
- Brendan D. McNally
- Stuart Coleman
- et al.
- 2014
- Nucl. Instrum. Methods Phys. Res
Titration of submonolayer Au growth on Si(111)
- Jaap Kautz
- M. Copel
- et al.
- 2014
- Physical Review B - CMMP
Giant piezoresistive On/Off ratios in rare-earth chalcogenide thin films enabling nanomechanical switching
- Matthew Copel
- Marcelo A. Kuroda
- et al.
- 2013
- Nano Letters
Selected topics in ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2013
- IEEE TNS
Ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2012
- IEEE TNS
Physical characterization of sub-32-nm semiconductor materials and processes using advanced ion beam-based analytical techniques
- M. Hopstaken
- D. Pfeiffer
- et al.
- 2012
- Surface and Interface Analysis
32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2011
- IEEE TNS
Alpha-particle emission energy spectra from materials used for solder bumps
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE TNS