Influence of misfit dislocations on the surface morphology of Si1-xGex films
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1995
- Applied Physics Letters
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119 results for P.M. Mooney
Measurements of alloy composition and strain in thin GexSi 1-x layers
- J.C. Tsang
- P.M. Mooney
- et al.
- 1994
- Journal of Applied Physics
Dislocation nucleation barrier in SiGe/Si structures graded to pure Ge
- P.M. Mooney
- F. Legoues
- et al.
- 1994
- Applied Physics Letters
Nucleation of dislocations in SiGe layers grown on (001)Si
- P.M. Mooney
- F.K. LeGoues
- et al.
- 1994
- Journal of Applied Physics
Origin of mosaic structure in relaxed Si1-xGex layers
- P.M. Mooney
- F.K. LeGoues
- et al.
- 1993
- ICDS 1993
Facet formation in strained Si1-x Gex films
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1994
- Surface Science
Strain relaxation and mosaic structure in relaxed SiGe layers
- P.M. Mooney
- F. Legoues
- et al.
- 1993
- Applied Physics Letters
Spatially resolved Raman spectroscopy of a step graded Ge xSi1-x strain relief structure
- J.C. Tsang
- F.H. Dacol
- et al.
- 1993
- Applied Physics Letters
Crystallographic tilting resulting from nucleation limited relaxation
- F. Legoues
- P.M. Mooney
- et al.
- 1993
- Applied Physics Letters
Raman scattering analysis of relaxed GexSi1-x alloy layers
- P.M. Mooney
- F.H. Dacol
- et al.
- 1993
- Applied Physics Letters