Charge trapping studies in SiO2 using high current injection from Si-rich SiO2 films
- D.J. DiMaria
- R. Ghez
- et al.
- 2008
- Journal of Applied Physics
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119 results for D.J. DiMaria
Attenuated total reflectance study of silicon-rich silicon dioxide films
- A. Hartstein
- D.J. Dimaria
- et al.
- 2008
- Journal of Applied Physics
Effects on interface barrier energies of metal-aluminum oxide-semiconductor (MAS) structures as a function of metal electrode material, charge trapping, and annealing
- D.J. DiMaria
- 2003
- Journal of Applied Physics
Anode hole injection, defect generation, and breakdown in ultrathin silicon dioxide films
- D.J. DiMaria
- J.H. Stathis
- 2001
- Journal of Applied Physics
Ultrathin high-K gate stacks for advanced CMOS devices
- E. Gusev
- D.A. Buchanan
- et al.
- 2001
- Technical Digest - International Electron Devices Meeting
Defect generation in ultrathin silicon dioxide films produced by anode hole injection
- D.J. DiMaria
- 2000
- Applied Physics Letters
Defect generation in field-effect transistors under channel-hot-electron stress
- D.J. DiMaria
- 2000
- Journal of Applied Physics
Electron energy dependence of metal-oxide-semiconductor degradation
- D.J. DiMaria
- 1999
- Applied Physics Letters
Defect generation under substrate-hot-electron injection into ultrathin silicon dioxide layers
- D.J. DiMaria
- 1999
- Journal of Applied Physics
Non-Arrhenius temperature dependence of reliability in ultrathin silicon dioxide films
- D.J. DiMaria
- J.H. Stathis
- 1999
- Applied Physics Letters