Publications

465 results at IEEE T-ED

Monte Carlo Simulation of Transport in Technologically Significant Semiconductors of the Diamond and Zinc-Blende Structures—Part II: Submicrometer MOSFET's
- - Massimo V. Fischetti
  - Steven E. Laux
- 1991
- IEEE T-ED
GaAs sees the light
- - J. Woodall
  - Alan C. Warren
  - et al.
- 1991
- IEEE T-ED
Characterization of a Photoresist with Wavelength Selected Tone
- - Lester A. Pederson
  - Andrew R. Neureuther
  - et al.
- 1990
- IEEE T-ED
Avalanche Electron Injection in 4-nm Si₃N₄/8-nm SiO₂ Dielectric Structure: Turn-Around Phenomenon and Si-SiO₂ Interface Degradation
- - Leonello Dori
  - Maurizio Severi
  - et al.
- 1990
- IEEE T-ED
On the Scaling Property of Trench Isolation Capacitance for Advanced High-Performance ECL Circuits
- - P.F. Lu
  - C.T. Chuang
- 1990
- IEEE T-ED
Frequency Response of Advanced Silicon Bipolar Transistors at Low Temperature
- - Keith A. Jenkins
- 1990
- IEEE T-ED
Low-Temperature Avalanche Multiplication In The Collector-Base Junction Of Advanced N-P-N Transistors
- - Pong-Fei Lu
- 1990
- IEEE T-ED
An Extension of the Reciprocity Theorem to Include High-Level Injection Conditions
- - G. Krieger
  - Y. Kwark
  - et al.
- 1990
- IEEE T-ED
One-Dimensional All Injection Nonquasi-static Models for Arbitrarily Doped Quasi-neutral Layers in Bipolar Junction Transistors Including Plasma-Induced Energy-Gap Narrowing
- - Ben S. Wu
  - Fredrik A. Lindholm
- 1990
- IEEE T-ED
On the Very-High-Current Degradations on Si n-p-n Transistors
- - Denny Duan-Lee Tang
  - Edward Hackbarth
  - et al.
- 1990
- IEEE T-ED