A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)
- Ernest Y. Wu
- James Stathis
- et al.
- 2015
- IRPS 2015
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15 results at IRPS 2015
Phase-change memory: Feasibility of reliable multilevel-cell storage and retention at elevated temperatures
- Milos Stanisavljevic
- A. Athmanathan
- et al.
- 2015
- IRPS 2015
TSV/FET proximity study using dense addressable transistor arrays
- Raphael P. Robertazzi
- Kanak Agarwal
- et al.
- 2015
- IRPS 2015
SOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
A collective relaxation model for resistance drift in phase change memory cells
- Abu Sebastian
- Daniel Krebs
- et al.
- 2015
- IRPS 2015