POWER7™ local clocking and clocked storage elements
- James Warnock
- Leon Sigal
- et al.
- 2010
- ISSCC 2010
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16 results for Ethan Cannon
Multi-bit upsets in 65nm SOI SRAMs
- Ethan H. Cannon
- Michael S. Gordon
- et al.
- 2008
- IRPS 2008
Protecting big blue from rogue subatomic particles
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2007
- ICICDT 2007
SRAM SER in 90, 130 and 180 NM bulk and SOI technologies
- Ethan H. Cannon
- Daniel D. Reinhardt
- et al.
- 2004
- IRPS 2004
SRAM ser in 90, 130 and 180 nm bulk and SOI technologies
- Ethan H. Cannon
- Daniel D. Reinhardt
- et al.
- 2004
- IRPS 2004
Soft error rate scaling for emerging SOI technology options
- P. Oldiges
- K. Bernstein
- et al.
- 2002
- VLSI Technology 2002
Design implications of single event transients in a commercial 45 nm SOI device technology
- Aj Kleinosowski
- Ethan H. Cannon
- et al.
- 2008
- IEEE TNS
Alpha-particle, carbon-ion and proton- induced flip-flop single-event-upsets in 65 nm bulk technology
- Larry Wissel
- Ethan H. Cannon
- et al.
- 2008
- IEEE TNS
Alpha-particle-induced upsets in advanced CMOS circuits and technology
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
Single-event-upset and alpha-particle emission rate measurement techniques
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev