POWER7™ local clocking and clocked storage elements
- James Warnock
- Leon Sigal
- et al.
- 2010
- ISSCC 2010
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16 results for Ethan Cannon
Design implications of single event transients in a commercial 45 nm SOI device technology
- Aj Kleinosowski
- Ethan H. Cannon
- et al.
- 2008
- IEEE TNS
Alpha-particle, carbon-ion and proton- induced flip-flop single-event-upsets in 65 nm bulk technology
- Larry Wissel
- Ethan H. Cannon
- et al.
- 2008
- IEEE TNS
Multi-bit upsets in 65nm SOI SRAMs
- Ethan H. Cannon
- Michael S. Gordon
- et al.
- 2008
- IRPS 2008
Single-event-upset and alpha-particle emission rate measurement techniques
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
Circuit design and modeling for soft errors
- A.J. KleinOsowski
- Ethan H. Cannon
- et al.
- 2008
- IBM J. Res. Dev
Alpha-particle-induced upsets in advanced CMOS circuits and technology
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
Phaser: Phased methodology for modeling the system-level effects of soft errors
- Jude A. Rivers
- Pradip Bose
- et al.
- 2008
- IBM J. Res. Dev
The impact of aging effects and manufacturing variation on SRAM soft-error rate
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2008
- IEEE T-DMR
Latch design techniques for mitigating single event upsets in 65 nm SOI device technology
- A.J. KleinOsowski
- Ethan H. Cannon
- et al.
- 2007
- IEEE TNS