G. Almasi, G. Almasi, et al.
Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Transmission line models and material parameters are extracted from time and frequency domain measurements for product related low loss card and ceramic MCM test line structures up to 65GHz. All measured results are compared to results as obtained from field calculations showing the advantages and limitations of the different methods on product driven test vehicles. © 2005 IEEE.
G. Almasi, G. Almasi, et al.
Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Ling Zhang, Wenjian Yu, et al.
IEEE Transactions on CPMT
Thomas-Michael Winkel, Hubert Harrer, et al.
EPEPS 2012
A. Deutsch, W.D. Becker, et al.
IEEE Topical Meeting EPEPS 1996