L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
This work reports on SiGe HBT technology withf max and f T of 350 GHz and 300 GHz, respectively, and a gate delay below 3.3 ps. This is the highest reported speed for any Si-based transistor in terms of combined performance of f max and f T both of which exhibit 300 GHz and above. Associated BV CEO and BV CBO are measured to be 1.7 V and 5.6 V, respectively. The dependence of device performance on bias condition and device dimension has been investigated. Considerations regarding the extraction of such high f max and f T values are also discussed. © 2004 IEEE.
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
Paul M. Solomon, Min Yang
IEDM 2004
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
Yu-Ming Lin, Joerg Appenzeller, et al.
IEDM 2004